The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 23, 2012
Filed:
Nov. 02, 2009
Conrad D. James, Albuquerque, NM (US);
Paul C. Galambos, Albuquerque, NM (US);
Mark S. Derzon, Albuquerque, NM (US);
Darin C. Graf, Albuquerque, NM (US);
Kenneth R. Pohl, Albuquerque, NM (US);
Chris J. Bourdon, Albuquerque, NM (US);
Conrad D. James, Albuquerque, NM (US);
Paul C. Galambos, Albuquerque, NM (US);
Mark S. Derzon, Albuquerque, NM (US);
Darin C. Graf, Albuquerque, NM (US);
Kenneth R. Pohl, Albuquerque, NM (US);
Chris J. Bourdon, Albuquerque, NM (US);
Sandia Corporation, Albuquerque, NM (US);
Abstract
Systems and methods for combining dielectrophoresis, magnetic forces, and hydrodynamic forces to manipulate particles in channels formed on top of an electrode substrate are discussed. A magnet placed in contact under the electrode substrate while particles are flowing within the channel above the electrode substrate allows these three forces to be balanced when the system is in operation. An optical detection scheme using near-confocal microscopy for simultaneously detecting two wavelengths of light emitted from the flowing particles is also discussed.