The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 23, 2012

Filed:

Dec. 21, 2006
Applicants:

Nader Engheta, Berwyn, PA (US);

Brian Edwards, Philadelphia, PA (US);

Inventors:

Nader Engheta, Berwyn, PA (US);

Brian Edwards, Philadelphia, PA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 27/26 (2006.01); G01N 27/447 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention is directed to the use of dielectrophoretic forces for the arbitrary manipulation of micrometer- and nanometer-sized particles and to devices capable of arbitrarily manipulating micrometer- and nanometer-sized particles by means of dielectrophoretic forces within a two- or three-dimensional region. The devices and methods of the invention are capable of arbitrarily controlling the velocities, locations, and forces applied to a particle, arbitrarily specifying a force or set of forces at a location in space, and determining friction and/or drag coefficients of a particle, and are thus well-suited for a range of applications including cell sorting, drug delivery, as a diagnostic tool for determining membrane stiffness, and in the heterogeneous integration of micro- and nano-components through directed assembly.


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