The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 23, 2012

Filed:

Sep. 02, 2010
Applicant:

Yuichiro Kanazawa, Okazaki, JP;

Inventor:

Yuichiro Kanazawa, Okazaki, JP;

Assignee:

Nidek Co., Ltd., Gamagori, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/02 (2006.01); A61B 3/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

An optometric apparatus for a subjective binocular visual performance test includes right and left test units including right and left housings, a plurality of optical elements disposed in the right and left housings, right and left test windows provided to the housings, in which desired optical elements selected from the optical elements are to be placed and through the selected optical elements, an optotype is presented to examinee's right and left eyes by an optotype presenting apparatus, right and left polarization plates having polarization axes perpendicular to each other and arranged to be placed in the test windows, and right and left protective covers arranged to be placed in the test windows at a side facing the optotype presenting apparatus and having polarization optical characteristics of changing circularly polarized light that passes through the right and left protective covers into linearly polarized light having polarization axes perpendicular to each other.


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