The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 23, 2012

Filed:

Apr. 21, 2011
Applicants:

Minoru Ohshima, Kanagawa, JP;

Michio Taniwaki, Kanagawa, JP;

Inventors:

Minoru Ohshima, Kanagawa, JP;

Michio Taniwaki, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B65H 7/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

A sheet measuring apparatus includes a first rotating member that includes a first peripheral surface portion that contacts a transported sheet; a second rotating member that includes a second peripheral surface portion made of a material different from that of the first peripheral surface portion, the second peripheral surface contacting the first peripheral surface portion and not contacting the sheet; a first rotation amount detecting unit that detects a first rotation amount that is a rotation amount of the first rotating member; a second rotation amount detecting unit that detects a second rotation amount that is a rotation amount of the second rotating member, the second rotation amount being used for a calculation related to the transported sheet; and a fault detecting unit that detects a fault that has occurred in the first rotating member on the basis of the first rotation amount and the second rotation amount.


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