The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 16, 2012

Filed:

Dec. 23, 2008
Applicant:

Steven Phillips, New York, NY (US);

Inventor:

Steven Phillips, New York, NY (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/173 (2006.01); G06F 17/00 (2006.01); H04L 27/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for managing sample selection bias is disclosed. Embodiments of the method can include automatically determining an unbiased estimate of a distribution from occurrence data via a special purpose processor. The occurrence data that is utilized in determining the estimate may have an occurrence data sample selection bias that is substantially equivalent to a background data sample selection bias associated with background data. Additionally, the occurrence data may be related to the background data, and the background data may be chosen with the background data sample selection bias. Furthermore, the occurrence data may represent a physically-measurable variable associated with one or more physical and tangible objects or substances.


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