The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 16, 2012

Filed:

Jun. 28, 2007
Applicants:

Ning Liu, Beijing, CN;

Jun Yan, Beijing, CN;

Benyu Zhang, Beijing, CN;

Zheng Chen, Beijing, CN;

Jian Wang, Beijing, CN;

Inventors:

Ning Liu, Beijing, CN;

Jun Yan, Beijing, CN;

Benyu Zhang, Beijing, CN;

Zheng Chen, Beijing, CN;

Jian Wang, Beijing, CN;

Assignee:

Microsoft Corporation, Redmond, WA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01); G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

Techniques for identifying similar queries based on their overall similarity and partial similarity of time series of frequencies of the queries are provided. To identify queries that are similar to a target query, the query analysis system generates, for each query, an overall similarity score for that query and the target query based on the time series of the query and the target query. The query analysis system also generates, for each query, partial similarity scores for the query and the target query based on various time sub-series of the overall time series of the queries. The query analysis system then identifies queries as being similar to the target query based on the overall similarity scores and the partial similarity scores of the queries.


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