The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 16, 2012
Filed:
Feb. 05, 2009
Randall Pirtle, Chandler, AZ (US);
Richard Foley, Chandler, AZ (US);
Amarnath Subrahmanya, Karnataka, IN;
Prakash Subramonian, Karnataka, IN;
Sandeep Baliga, Karnataka, IN;
Ramji Sethu, Tamilnadu, IN;
Nitesh Lall, Madhya Pradesh, IN;
Randall Pirtle, Chandler, AZ (US);
Richard Foley, Chandler, AZ (US);
Amarnath Subrahmanya, Karnataka, IN;
Prakash Subramonian, Karnataka, IN;
Sandeep Baliga, Karnataka, IN;
Ramji Sethu, Tamilnadu, IN;
Nitesh Lall, Madhya Pradesh, IN;
Honeywell International Inc., Morristown, NJ (US);
Abstract
Methods and systems are provided for predicting the reliability of a plurality of products that will be deployed during a product deployment period comprising a plurality of time intervals. The method comprises retrieving historical product removal data from a product removal data source, retrieving historical product shipment data from a product shipment data source, identifying a plurality of Weibull parameters based on at least a portion of retrieved product removal data and product shipment data, and performing a plurality of product deployment simulations, wherein each product deployment simulation includes predicting a lifespan for each of the plurality of products and determining reliability metrics for uniform time intervals during the product deployment period.