The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 16, 2012
Filed:
Jan. 14, 2010
Tye Brady, Southborough, MA (US);
Timothy Henderson, Ashland, MA (US);
Richard Phillips, Sudbury, MA (US);
Doug Zimpfer, Houston, TX (US);
Tim Crain, Taylor Lake Village, TX (US);
Tye Brady, Southborough, MA (US);
Timothy Henderson, Ashland, MA (US);
Richard Phillips, Sudbury, MA (US);
Doug Zimpfer, Houston, TX (US);
Tim Crain, Taylor Lake Village, TX (US);
The Charles Stark Draper Laboratory, Inc., Cambridge, MA (US);
The United States of America as Represented by the Administrator of the National Aeronautics and Space Administration, Washington, DC (US);
Abstract
In one embodiment, a system for providing fault-tolerant inertial measurement data includes a sensor for measuring an inertial parameter and a processor. The sensor has less accuracy than a typical inertial measurement unit (IMU). The processor detects whether a difference exists between a first data stream received from a first inertial measurement unit and a second data stream received from a second inertial measurement unit. Upon detecting a difference, the processor determines whether at least one of the first or second inertial measurement units has failed by comparing each of the first and second data streams to the inertial parameter.