The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8290729 B1

PDF
Full Text
Expired
Date of Patent:
Oct. 16, 2012

Filed:

Jun. 16, 2010
Applicants:

Jui-hsiung Ho, Taipei Hsien, TW;

Wang-ding Su, Taipei Hsien, TW;

Inventors:

Jui-Hsiung Ho, Taipei Hsien, TW;

Wang-Ding Su, Taipei Hsien, TW;

Assignee:

Hon Hai Precision Industry Co., Ltd., Tu-Cheng, New Taipei, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 29/027 (2006.01);
U.S. Cl.
CPC ...
Abstract

In a low voltage differential signal (LVDS) timing test system and method, a clock signal waveform and a data signal waveform are obtained. Clock cycles are selected from the clock signal waveform. Data bits transmitted within the selected clock cycles are identified from the data signal waveform. Accordingly, bit positions of the data bits are determined.


Find Patent Forward Citations

Ho, Jui-Hsiung. (2012). Low voltage differential signaling timing test system and method (U.S. Patent No. 8290729). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8290729

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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