The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 16, 2012

Filed:

Oct. 28, 2009
Applicants:

SO Kitazawa, Mito, JP;

Naoyuki Kono, Mito, JP;

Atsushi Baba, Tokai, JP;

Inventors:

So Kitazawa, Mito, JP;

Naoyuki Kono, Mito, JP;

Atsushi Baba, Tokai, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2011.01);
U.S. Cl.
CPC ...
Abstract

An ultrasonic probe issues an ultrasonic wave to an object, receives a reflected wave from an object, and is provided with multiple piezoelectric elements. A three-dimensional display section displays three-dimensional flaw detection data superimposed on three-dimensional shape data of an object. The computer acquires a reflected ultrasonic wave signal from a reference object (reference). Based on the acquired signal, the computer corrects a reflected ultrasonic wave signal acquired from another object having the same material and shape as the reference. The computer allows the three-dimensional display section to display three-dimensional flaw detection data generated from a reflected ultrasonic wave signal resulting from a difference between a reference and an object.


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