The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 16, 2012

Filed:

Aug. 01, 2008
Applicants:

Toshiaki Nakajima, Sakura, JP;

Kenji Yasuhara, Sakura, JP;

Inventors:

Toshiaki Nakajima, Sakura, JP;

Kenji Yasuhara, Sakura, JP;

Assignee:

Fujikura Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 10/08 (2006.01); H04B 10/12 (2006.01);
U.S. Cl.
CPC ...
Abstract

An optical line monitoring apparatus, including: a group information recording portion which records group information about to which splitter respective terminators are connected; a normal information recording portion which records intensities of reflected lights from a plurality of terminators in a state in which a failure is not occurring in optical lines; a monitored information recording portion which records intensities of reflected lights from the plurality of terminators in failure monitoring time; an attenuation amount determination portion which determines a terminator the reflected light intensity of which is attenuated compared with the corresponding reflected light intensity in normal information; and a control portion which determines, if the intensities of the reflected lights of all the terminators connected to the same splitter are attenuated by the same value, that a failure has occurred between the test apparatus and the splitter to which all the terminators are connected.


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