The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 16, 2012
Filed:
Dec. 02, 2009
Wen-yi Wu, Shenzhen, CN;
Qing-hua Liu, Shenzhen, CN;
Yong-hui Xiao, Shenzhen, CN;
Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd., Shenzhen, Guangdong Province, CN;
Hon Hai Precision Industry Co., Ltd., Tu-Cheng, New Taipei, TW;
Abstract
A method for detecting blemishes in a RGB image captured by an electronic device includes following steps. The image is read from the electronic device. A center point of the image is defined. Pixels of radials radiating from the center point of the image are detected for detecting blemishes in the image. Blemishes in the image are counted. A total blemish number is compared with a maximum tolerable blemish number. If the total blemish number in the image exceeds the maximum tolerable blemish number, displaying test failure; and if the total blemish number in the image does not exceeds the maximum tolerable number, displaying test pass. A blemish detection system associated with the method is also disclosed.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile