The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 16, 2012
Filed:
Oct. 17, 2008
Vincent Loriette, Paris, FR;
Benoît Dubertret, Paris, FR;
Pedro Felipe Gardeazabal Rodriguez, Los Angeles, CA (US);
Vincent Loriette, Paris, FR;
Benoît Dubertret, Paris, FR;
Pedro Felipe Gardeazabal Rodriguez, Los Angeles, CA (US);
Centre National de la Recherche Scientifique—CNRS, Paris Cedex, FR;
Abstract
The invention relates to a structured illumination system () for the three-dimensional microscopy of a sample (), that comprises: beam generation means () adapted for generating coherent light beams (I, I, I); a lens () having a rear focal plane (PFA), and arranged so that the sample () can be placed in the focalisation plane (PMP) of the lens; focalisation means () arranged for focusing the light beams in the rear focal plane (PFA) so that the beams interfere in a collimated manner in the focalisation plane (PMP) of the lens (); characterised in that the beam generation means () includes a light space modulator () programmed for diffracting a light signal () in order to generate at least two different diffracted beams ((I, I), (I, I)) that are not symmetrical relative to the lens optical axis, wherein the light space modulator includes a calculator adapted for applying a constant phase term to each of said at least two coherent beams.