The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 16, 2012

Filed:

Jan. 15, 2009
Applicants:

Masatake Hyoudou, Ehime, JP;

Takuya Suzuki, Ehime, JP;

Inventors:

Masatake Hyoudou, Ehime, JP;

Takuya Suzuki, Ehime, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/14 (2006.01);
U.S. Cl.
CPC ...
Abstract

An analyzing deviceincludes position detection marks, each having one of a reflective surface, a refractive surface, and a light shielding surface that block output light incident on a sensorfrom a light sourcewhen the output light reaches a rotation detection position just before or behind measurement spots, andof the analyzing device. Output signals from the sensorfor reading the measurement spots, andare stored in a memory, the positions of the measurement spots, andare determined based on light receiving data stored in the memory, and only a desired analyzing signal is extracted. Thus even when the number of measurement spots increases, it is possible to read the measurement spots without adding any components.


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