The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 16, 2012
Filed:
Sep. 14, 2009
Johannes Kraus, Theilheim, DE;
Alois Herkommer, Aalen, DE;
Bernhard Weigl, Steinheim, DE;
Michel Le Maire, Oberkochen, DE;
Holger Muenz, Aalen, DE;
Johannes Kraus, Theilheim, DE;
Alois Herkommer, Aalen, DE;
Bernhard Weigl, Steinheim, DE;
Michel Le Maire, Oberkochen, DE;
Holger Muenz, Aalen, DE;
Carl Zeiss Laser Optics GmbH, Oberkochen, DE;
Abstract
A spectrometer arrangement for measuring a spectrum of a light beam emitted by a narrowband light source, such as a bandwidth-narrowed laser, includes at least one etalon, a beam splitter for splitting the light beam into a first partial beam and a second partial beam, one or more optical directing elements for directing the first partial beam n times and the second partial beam (n+k) times through the at least one etalon, wherein n and k are integers ≧1. The spectrometer arrangement further has at least one light-sensitive detector and an evaluation device for evaluating the spectra—recorded by the at least one detector—of the first partial beam that has passed through the at least one etalon n times and of the second partial beam that has passed through the at least one etalon (n+k) times in order to determine the light spectrum corrected for the apparatus function of the at least one etalon.