The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 16, 2012
Filed:
Apr. 30, 2010
Applicants:
Yusuke Matsumoto, Hachioji, JP;
Hirofumi Yamamoto, Hino, JP;
Inventors:
Yusuke Matsumoto, Hachioji, JP;
Hirofumi Yamamoto, Hino, JP;
Assignee:
Olympus Corporation, Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/02 (2006.01); G02B 21/06 (2006.01); H04N 7/18 (2006.01);
U.S. Cl.
CPC ...
Abstract
A microscope, which moves an objective lens along an observation optical axis with respect to a specimen, includes an imaging unit and a supporting unit. The imaging unit has an imaging lens, which is arranged on the observation optical axis and forms an observation image of the specimen, and an imaging element, which is arranged on the observation optical axis and takes the observation image, and is optically connected to the objective lens by a parallel light flux. The supporting unit fixedly supports the imaging unit, and movably supports the objective lens.