The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 16, 2012

Filed:

Mar. 24, 2005
Applicants:

Izhak Baharav, Palo Alto, CA (US);

Robert C. Taber, Palo Alto, CA (US);

Gregory S. Lee, Mountain View, CA (US);

Inventors:

Izhak Baharav, Palo Alto, CA (US);

Robert C. Taber, Palo Alto, CA (US);

Gregory S. Lee, Mountain View, CA (US);

Assignee:

Agilent Technologies, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01Q 15/14 (2006.01); H01Q 3/38 (2006.01); G01S 13/89 (2006.01);
U.S. Cl.
CPC ...
Abstract

An antenna array for use within a microwave imaging system to capture a microwave image of a target is selectively programmed to optimize one or more parameters of the microwave imaging system. The array includes a plurality of antenna elements, each capable of being programmable with a respective phase shift to direct a beam of microwave radiation toward the target such that the microwave radiation from each of the plurality of antenna elements arrives at the target substantially in-phase. To optimize a parameter of the microwave imaging system, the phase shifts of selective ones of the antenna elements are altered, while still maintaining the substantially in-phase microwave radiation at the target.


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