The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 16, 2012
Filed:
May. 01, 2009
Paul Meyer, McVeytown, PA (US);
Jeffrey Anderson, Lewistown, PA (US);
Anand Desai, Lewistown, PA (US);
Wei Luo, Boalsburg, PA (US);
Paul Meyer, McVeytown, PA (US);
Jeffrey Anderson, Lewistown, PA (US);
Anand Desai, Lewistown, PA (US);
Wei Luo, Boalsburg, PA (US);
General Electric Company, Schenectady, NY (US);
Abstract
An apparatus and system for measuring material thickness of a test object. In one embodiment, the apparatus can include a measurement probe that can have a plurality of transducer elements that can include transmitter elements and receiver elements arranged, respectively, in on a first side and a second side of a gap. The first side and the second side can form a scan area with at least one active group that can have at least one transmitter element and at least one receiver element, which can be separated from the transmitter element in a spaced relationship.