The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 09, 2012

Filed:

Mar. 06, 2009
Applicants:

Srimat Chakradhar, Manalapan, NJ (US);

Anand Raghunathan, West Lafayette, IN (US);

Jiayuan Meng, Charlottesville, VA (US);

Inventors:

Srimat Chakradhar, Manalapan, NJ (US);

Anand Raghunathan, West Lafayette, IN (US);

Jiayuan Meng, Charlottesville, VA (US);

Assignee:

NEC Laboratories America, Inc., Princeton, NJ (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/46 (2006.01);
U.S. Cl.
CPC ...
Abstract

Implementations of the present principles include Best-effort computing systems and methods. In accordance with various exemplary aspects of the present principles, a application computation requests directed to a processing platform may be intercepted and classified as either guaranteed computations or best-effort computations. Best-effort computations may be dropped to improve processing performance while minimally affecting the end result of application computations. In addition, interdependencies between best-effort computations may be relaxed to improve parallelism and processing speed while maintaining accuracy of computation results.


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