The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 09, 2012
Filed:
Sep. 15, 2009
Jim G. Foster, Sr., Morrisville, NC (US);
Sumeet Kochar, Apex, NC (US);
Suzanne M. Michelich, Iii, Waukesha, WI (US);
Jacques B. Taylor, Raleigh, NC (US);
Jim G. Foster, Sr., Morrisville, NC (US);
Sumeet Kochar, Apex, NC (US);
Suzanne M. Michelich, III, Waukesha, WI (US);
Jacques B. Taylor, Raleigh, NC (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method for self-contained testing within a DRAM comprises the DRAM receiving an instruction from an external processor to test a memory core on the DRAM, and the DRAM self-testing the memory core with one or more BIST pattern stored in a multipurpose register on the DRAM. Optionally, the step of self-testing may include writing the BIST pattern into all locations of the memory core, reading each location of the memory core, and comparing the content read from each location of the memory core with the BIST pattern, wherein a negative comparison indicates a failure has occurred. In a further option, the method may further comprise, after testing the DRAM, initializing the DRAM with an INIT pattern stored in the multipurpose register on the DRAM.