The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 09, 2012
Filed:
Feb. 15, 2008
Applicant:
Kenneth F. Emigholz, Chevy Chase, MD (US);
Inventor:
Kenneth F. Emigholz, Chevy Chase, MD (US);
Assignee:
ExxonMobil Research and Engineering Company, Annandale, NJ (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
Abstract
The present invention is a method and system for detecting an abnormal on-line analysis or laboratory measurement and for predicting an abnormal quality excursion due to an abnormal process condition.
Emigholz, Kenneth. (2012). Method and system of using inferential measurements for abnormal event detection in continuous industrial processes (U.S. Patent No. 8285513). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8285513
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile