The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 09, 2012
Filed:
Jul. 09, 2008
Kiyoshi Yanagisawa, Tokyo, JP;
Noriaki Matsuno, Tokyo, JP;
Kiyoshi Yanagisawa, Tokyo, JP;
Noriaki Matsuno, Tokyo, JP;
NEC Corporation, Tokyo, JP;
Abstract
An apparatus includes a test signal generation unit supplying test signals to an orthogonal modulator and a control unit that based on a result of decision by comparison and decision of detection results of a detector detecting envelopes of modulated signals output from the orthogonal modulator responsive to the test signals, derives adjustment values and a compensation value. An estimation means estimates a DC offset and an IQ mismatch of the orthogonal modulator, based on the derived compensation value. The test signals includes a first set including a first test signal (I, Q) and a second test signal (I, Q) having a predetermined relationship with the first test signal, and a second set of which in-phase and quadrature components have predetermined relationships respectively with in-phase and quadrature components of the first set.