The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 09, 2012
Filed:
May. 09, 2008
Akio Yamazaki, Shiojiri, JP;
Akio Yamazaki, Shiojiri, JP;
Seiko Epson Corporation, Tokyo, JP;
Abstract
To improve modification result where areas targeted for modification overlap, an image processing apparatus is provided. The image processing apparatus has a modification area establishing unit capable to establish a plurality of modification areas on a target image by analyzing the target image; an overlap detecting unit that detects overlapping of the plurality of modification areas; and a modification processing unit that modifies an image within a partial area including an overlapping portion of the plurality of modification areas in a reduced modification level in the case that the overlapping is detected by the overlap detecting unit, the reduced modification level being smaller than a modification level used in the case that the overlapping is not detected, the partial area belonging to at least one of the plurality of modification areas.