The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 09, 2012

Filed:

Sep. 17, 2007
Applicant:

Yasuhiro Komiya, Tokyo, JP;

Inventor:

Yasuhiro Komiya, Tokyo, JP;

Assignee:

Olympus Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/66 (2006.01); G06K 9/40 (2006.01);
U.S. Cl.
CPC ...
Abstract

An image storage portionstores image data that is input. An outline detecting portiondetects an outline of tooth that is the object of color measurement in the image based on the image data. A specular reflection region detecting portiondetects the position of a specular reflection region in the tooth that is the object of color measurement based on the data of each pixel that constitutes the image. A rectangular region setting portionsets an analysis region to become the object of analysis processing in the image based on the position of the specular reflection region that is detected by the specular reflection region detecting portion. In accordance with the present invention, it is possible to avoid setting an analysis region in a specular reflection region when setting an analysis region, that is the object of analysis processing of an image, in the image.


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