The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 09, 2012
Filed:
Mar. 27, 2008
Bert Dirix, Tienen, BE;
Dirk Adams, Tongeren, BE;
Pieter Op DE Beeck, Kortenaken, BE;
VISYS NV, Hasselt, BE;
Abstract
Disclosed is a method and system for inspecting and sorting unsuitable or irregular objects in a stream of products, the system includes means for scanning the stream of products along a scan line. The scan line is formed by means of at least one light source directing light along the scan line, and means for detecting light beams reemitted by the product stream upon scanning. The scanning means includes a focusing means for concentrating the light in at least one dimension. The detecting means includes a focusing means for forming an image in an image plane. The detecting means is oriented towards the scan line such that points on the scan line form a projected scan line in the image plane and the image substantially located in the image plane is substantially focused in at least one dimension by the focusing means. The detecting means also includes a spatial filtering means that filters the image in substantially the direction perpendicular to the direction of the projected scan line.