The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8285013 B1

PDF
Full Text
Expired
Date of Patent:
Oct. 09, 2012

Filed:

Mar. 05, 2008
Applicant:

Yoshiyuki Moriya, Minato-ku, JP;

Inventor:

Yoshiyuki Moriya, Minato-ku, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An image processing apparatus having improved detection performance for detecting an abnormal shadow, such as a tumor, and reducing a burden on the user is disclosed. In the image processing apparatus, an aligning unit aligns a previous image and a current diagnosis image with each other, and a corresponding position calculating unit calculates a position on a subject in the current diagnosis image corresponding to the position of an abnormal shadow on the subject in the previous image based on positional information of the abnormal shadow on the subject in the previous image and alignment information. A current diagnosis image abnormal shadow detecting unit detects the abnormal shadow in the current diagnosis image from the vicinity of the corresponding position in the current diagnosis image.


Find Patent Forward Citations

Moriya, Yoshiyuki. (2012). Method and apparatus for detecting abnormal patterns within diagnosis target image utilizing the past positions of abnormal patterns (U.S. Patent No. 8285013). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8285013

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