The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 09, 2012

Filed:

Sep. 17, 2010
Applicants:

Masahiro Yoshihara, Yokohama, JP;

Teruo Takagiwa, Yokohama, JP;

Katsumi Abe, Yokohama, JP;

Inventors:

Masahiro Yoshihara, Yokohama, JP;

Teruo Takagiwa, Yokohama, JP;

Katsumi Abe, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 16/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

According to one embodiment, a semiconductor memory device includes memory cells, holding circuits, and a logical gate chain. The memory cells are associated with columns. The holding circuits are associated with the columns and capable of holding first information indicating whether associated one of the columns is a verify-failed column or not. The logical gate chain includes a plurality of first logical gates associated with the columns and connected in series. Each of the first logical gates outputs a logical level to a next-stage first logical gate in a series connection. The logical level indicates whether the verify-failed column exists or not based on the first information in associated one of the holding circuit. The content indicated by the logical level output from each of the first logical gates is inverted using one of the first logical gates associated with the verify-failed column as a border.


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