The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 09, 2012
Filed:
Oct. 17, 2006
Armin Rudert, Essen, DE;
Armin Rudert, Essen, DE;
Isra Vision AG, Darmstadt, DE;
Abstract
A system for the optical inspection of glass panels () is described, with a conveying device () for moving a glass panel (), and with a first inspection module (), which includes an illumination device and a camera for illuminating and photographing the glass panel (), and with a first evaluation module () for evaluating the photographs of the glass panel (). In addition, a second inspection module () is provided, which includes an illumination device or a camera for illuminating the photograph of the glass panel (), and it is connected with a second evaluation module () for evaluating the photographs taken of the glass panel, the illumination systems and/or the cameras of the first inspection module () and the second inspection module () having different designs and/or being located in different places relative to the glass panel (), which is moved past the inspection modules () via the conveying device. The present invention also relates to a method carried out using this system ().