The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 09, 2012

Filed:

Nov. 30, 2010
Applicants:

Taro Beppu, Obu, JP;

Kiyokazu Takagi, Okazaki, JP;

Takashi Ogawa, Nagoya, JP;

Hiroshi Hazumi, Nagoya, JP;

Inventors:

Taro Beppu, Obu, JP;

Kiyokazu Takagi, Okazaki, JP;

Takashi Ogawa, Nagoya, JP;

Hiroshi Hazumi, Nagoya, JP;

Assignee:

Denso Corporation, Kariya, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 3/08 (2006.01); G01S 13/93 (2006.01); G06K 9/46 (2006.01);
U.S. Cl.
CPC ...
Abstract

An object recognition apparatus performs a sweep of a scanned region by transmitting scanning wave beams at respective scan angles and successive timings, derives a received-wave signal strength value and reflection location corresponding to each scan wave beam during the sweep, and assigns a set of mutually adjacent reflection locations as a segment. A corresponding range value of the segment is calculated, expressing an estimated distance of a detected object. A threshold value is derived in accordance with the segment range, a region of the segment in which the signal strength values exceed the threshold value is extracted, and the width of the extracted region is designated as the width of the detected object.


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