The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 09, 2012
Filed:
Feb. 14, 2009
Volodymyr I Redko, Coral Springs, FL (US);
Volodymyr S Khandetskyy, Dnipropetrovsk, UA;
Elena M. Shembel, Coral Springs, FL (US);
Volodymyr I Redko, Coral Springs, FL (US);
Volodymyr S Khandetskyy, Dnipropetrovsk, UA;
Elena M. Shembel, Coral Springs, FL (US);
Enerize Corporation, Coral Springs, FL (US);
Abstract
The present invention is a method and apparatus for optical detection and size evaluation of through-penetrating defects such as pinholes in moving foil or film. The invention comprises the installation of at least one image capture device at a first given distance over the moving foil surface, placement of at least one elongated light source comprising an infinite number of point-sources that are not in phase, and are emitting light independently from one another under the foil, periodic automatic computer-controlled image capture of the foil surface with image capture devices, automatic transmission of the image captured by each device to a control computer, and processing of the transmitted image data to detect of defect light spot, followed by determination of generalized index of its initial image. This generalize index value is equal to the brightness averaged within the spot multiplied by the area of the spot. The invention further includes reporting the presence of a through-penetrating defect when the generalized index value exceeds a preset threshold. characteristics of the defect spots.