The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 09, 2012
Filed:
Jun. 24, 2010
Matthew P. Jevons, Derby, GB;
Matthew P. Jevons, Derby, GB;
Rolls-Royce PLC, London, GB;
Abstract
The present invention relates to a Test apparatus () for testing the interaction between through-thickness compression and shear in a test piece (). The apparatus comprises first and second chocks () arranged in use to securely retain a test piece, and first and second races () which can be controllably urged towards each other to transmit a known force to the first and second chocks. The first and second chocks and the test piece together form a substantially cylindrical body of a first diameter and. The first and second races define therebetween a substantially cylindrical space of a second diameter for accommodating the chocks, and wherein the second diameter is greater than the first diameter.