The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 09, 2012

Filed:

Dec. 17, 2008
Applicant:

Pierre Leroux, Rancho Santa Margarita, CA (US);

Inventor:

Pierre Leroux, Rancho Santa Margarita, CA (US);

Assignee:

Nanovea, Inc., Irvine, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 3/48 (2006.01); G01N 3/42 (2006.01);
U.S. Cl.
CPC ...
Abstract

A non-contact sensor is attached to the indenting module with its working range encompassing the tip of the indenter. The sensor directly measures penetration depth of the indenter during scratch, wear or instrumented hardness testing. During the test, the non-contact sensor records the height of the surface as the indenter penetrates the surface of the testing specimen.


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