The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 09, 2012

Filed:

Nov. 09, 2009
Applicant:

Hajime Bungo, Muko, JP;

Inventor:

Hajime Bungo, Muko, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention provides a detector for a chromatograph capable of obtaining the accurate retention time, even if there is a frequency deviation of the clock signal for determining the timing of data sampling, by conforming the progress of the detector internal time accompanied with the repetition of the sampling to that of real time. In the detector, consecutive data sampling intervals are defined to be a time adjustment period, and in one time adjustment period, each of the sampling intervals whose number is given as the interpolation value M is elongated by a predetermined number of clock counts compared to each of the other sampling intervals. If the clock signal has a positive frequency deviation, the apparatus internal time determined by the clock signal progresses faster than real time. However, providing the interpolation value M corresponding to the amount of the frequency deviation elongates the time adjustment period on the basis of the apparatus internal time, to be conformed to the time adjustment period on the basis of real time which is determined by the sampling period.


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