The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 02, 2012
Filed:
Mar. 07, 2011
Applicants:
Christopher L. Stork, Albuquerque, NM (US);
Luke N. Brewer, Marina, CA (US);
Inventors:
Christopher L. Stork, Albuquerque, NM (US);
Luke N. Brewer, Marina, CA (US);
Assignee:
Sandia Corporation, Albuquerque, NM (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
Large data sets are analyzed by hierarchical clustering using correlation as a similarity measure. This provides results that are superior to those obtained using a Euclidean distance similarity measure. A spatial continuity constraint may be applied in hierarchical clustering analysis of images.
Quick Actions:
Stork, Christopher. (2012). Hierarchical clustering using correlation metric and spatial continuity constraint (U.S. Patent No. 8280887). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8280887
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