The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 02, 2012
Filed:
Apr. 16, 2007
Allon Adir, Kiryat Tivon, IL;
Sigal Asaf, Zichron Yaakov, IL;
Laurent Fournier, Givat Ela, IL;
Itai Jaeger, Lavon, IL;
Allon Adir, Kiryat Tivon, IL;
Sigal Asaf, Zichron Yaakov, IL;
Laurent Fournier, Givat Ela, IL;
Itai Jaeger, Lavon, IL;
International Business Machines Corporation, Armonk, NY (US);
Abstract
A parametrically controlled model-based test generator automatically generates architectural compliance test suites for different implementations of a processor architecture, based on a set of architectural decisions chosen among optional behaviors for each implementation. Thus, different implementations of the same architecture can be easily supported by modifying the parameter values. In addition, ongoing changes to the architecture or comprehensive updates to the test suite can be easily handled by updating the architecture model or the coverage models, forgoing the need to review the whole, potentially huge, set of tests.