The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 02, 2012
Filed:
Dec. 07, 2009
John E. Richter, Trumbull, CT (US);
John W. Sussmeier, Cold Spring, NY (US);
John E. Richter, Trumbull, CT (US);
John W. Sussmeier, Cold Spring, NY (US);
Pitney Bowes Inc., Stamford, CT (US);
Abstract
A method of detecting mailpiece thickness includes detecting a leading edge of the mailpiece, moving a detecting roller downwardly over a first predetermined period of time from a first position to a second position where it contacts the mailpiece, increasing a compressive force applied by the detecting roller to the mailpiece from an initial force to a predetermined measurement force over a second predetermined period of time, and applying the measurement force to the mailpiece for a third predetermined period of time. The method further includes applying the measurement force to the mailpiece for a fourth predetermined period of time and making a number of thickness measurements of the mailpiece based on a position of the detecting roller, and determining the thickness of the mailpiece based on the number of thickness measurements.