The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 02, 2012

Filed:

May. 16, 2008
Applicant:

Hiroshi Nakamura, Kyoto, JP;

Inventor:

Hiroshi Nakamura, Kyoto, JP;

Assignee:

Horiba, Ltd., , JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 31/00 (2006.01); F01N 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus for measuring particulate matters includes a particulate matters collecting partthat collects particulate matters contained in exhaust gas from an engineby a collecting filterduring a predetermined period while the engineis dynamically driven. A second measuring partcontinuously measures properties indirectly indicating the mass of the particulate matters contained in the exhaust gas during the predetermined period. A correlation calculating partcalculates a correlation between the measurement result of the mass of the particulate matters collected by the particulate matters collecting partand a time integration value of the measurement result in the second measuring partduring the predetermined period. A converting partconverts the continuous measurement data in the second measuring partinto a time series variation of the mass of the particulate matters based on the correlation.


Find Patent Forward Citations

Nakamura, Hiroshi. (2012). Method and apparatus of measuring particulate matters (U.S. Patent No. 8280645). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8280645

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…