The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 02, 2012
Filed:
Sep. 10, 2009
Takahiro Masumura, Tucson, AZ (US);
Takahiro Masumura, Tucson, AZ (US);
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
A measurement apparatus includes a measurement unit configured to irradiate three types of ultrasonic waves and light upon a test region in a test object, and to measure modulated light and non-modulated light, the modulated light being modulated by an acousto-optical effect, and a signal processor configured to calculate a modulation depth that is an intensity of the modulated light divided by an intensity of the non-modulated light for the one, and at least one of a scattering characteristic and an absorption characteristic of the test region in the test object by utilizing a first change rate of the modulation depth to an amplitude of the one or an amount corresponding to the first change rate, and a second change rate of the modulation depth to a frequency of the one or an amount corresponding to the second change rate.