The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 02, 2012

Filed:

Jul. 22, 2010
Applicants:

Eric N. Boe, Long Beach, CA (US);

William L. Lewis, Redondo Beach, CA (US);

John Fraschilla, Playa Vista, CA (US);

Inventors:

Eric N. Boe, Long Beach, CA (US);

William L. Lewis, Redondo Beach, CA (US);

John Fraschilla, Playa Vista, CA (US);

Assignee:

Raytheon Company, Waltham, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and system use the mutual coupling property of multiple antenna elements for characterizing signal waveform distortion introduced by items in the signal path, including the antenna elements, of a radio frequency transmit/receive system. The method and system alleviate the need for external test equipment by using the same hardware used in standard operation of the transmit/receive system for performing waveform distortion characterization through the generation, mutual coupling, and acquisition of a reference signal. In an embodiment involving application of complementary inverse predistortion to generation of an operational signal and/or to processing of a received operational signal, the signal as received and processed during standard system operation is compensated for distortion contributed by system hardware, improving impulse response and system performance.


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