The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 02, 2012

Filed:

Feb. 05, 2008
Applicant:

Tomoharu Kiyuna, Tokyo, JP;

Inventor:

Tomoharu Kiyuna, Tokyo, JP;

Assignee:

NEC Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A cell feature amount calculating apparatus is provided that is capable of capturing the state of nuclear DNA. This cell feature amount calculating apparatus includes an image input unit that inputs an image of a cell, a cell nucleus region extracting unit that extracts a cell nucleus region of the cell from the image, a standard contour length calculating unit that calculates a standard contour length of the cell nucleus region, a contour length sequence calculating unit that extracts, for each threshold value of a plurality of different threshold values, a specific region which is a region having a pixel value larger than or equal to the threshold value from the cell nucleus region and calculating a contour length sequence by calculating a contour length of the specific region, and a contour complexity calculating unit that calculates a feature amount of the cell based on the standard contour length and the contour length sequence.


Find Patent Forward Citations

Loading…