The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 02, 2012

Filed:

Sep. 04, 2006
Applicants:

Erik B. Dam, Copenhagen, DK;

Jenny Folkesson, San Francisco, CA (US);

Paola Pettersen, Koege, DK;

Ole F. Olsen, Vaerloese, DK;

Mads Nielsen, Dragoer, DK;

Claus Christiansen, Morcote, CH;

Inventors:

Erik B. Dam, Copenhagen, DK;

Jenny Folkesson, San Francisco, CA (US);

Paola Pettersen, Koege, DK;

Ole F. Olsen, Vaerloese, DK;

Mads Nielsen, Dragoer, DK;

Claus Christiansen, Morcote, CH;

Assignee:

Synarc Inc., Newark, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for the analysis of three dimensional scan data representing an articular cartilage is provided to extract a quantitative parameter indicative of joint pathology. A measure of local curvature of the cartilage is determined within a region of interest. The value of the quantitative parameter of this joint derived from this measure is compared with the value of a similar quantitative parameter previously established in respect of healthy joints and/or joints characterized by a pathology.


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