The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 02, 2012

Filed:

Nov. 05, 2007
Applicants:

Marcin Michal Kmiecik, Lodz, PL;

Arkadiusz Wysocki, Lodz, PL;

Inventors:
Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of identifying a planar object in source images is disclosed. In at least one embodiment, the method includes: retrieving a first source image obtained by a first terrestrial based camera; retrieving a second source image obtained by a second terrestrial based camera; retrieving position data associated with the first and second source image; retrieving orientation data associated with the first and second source image; performing a looking axis rotation transformation on the first and second source image by use of the associated position data and orientation data to obtain first and second intermediate images, wherein the first and second intermediate images have an identical looking axis; performing a radial logarithmic space transformation on the first and second intermediate images to obtain first and second radial logarithmic data images; detecting an area in the first image potentially being a planar object; comparing the potential planar object having similar dimensions in the second radial logarithmic data image and similar rgb characteristics; and finally, identifying the area as a planar object and determining its position. At least one embodiment of the method enables the engineer to detect very efficiently planar perpendicular objects in subsequent images.


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