The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 02, 2012
Filed:
Nov. 10, 2009
Toshiyasu Suyama, Hamamatsu, JP;
Tadashi Maruno, Hamamatsu, JP;
Toshihide Sasaki, Hamamatsu, JP;
Junichi Sonoda, Hamamatsu, JP;
Shinji Takihi, Hamamatsu, JP;
Toshiyasu Suyama, Hamamatsu, JP;
Tadashi Maruno, Hamamatsu, JP;
Toshihide Sasaki, Hamamatsu, JP;
Junichi Sonoda, Hamamatsu, JP;
Shinji Takihi, Hamamatsu, JP;
Hamamatsu Photonics K.K., Hamamatsu-shi, Shizuoka, JP;
Abstract
An X-ray image acquiring system capable of improving the detection accuracy of a foreign substance contained in a subject is provided. An X-ray image acquiring systemirradiates X-rays to a subject S having a predetermined thickness W from an X-ray source, and detects X-rays transmitted through the subject S in a plurality of energy ranges. The X-ray image acquiring systemincludes a low-energy detectorfor detecting, in a low-energy range, X-rays having been transmitted through a region Rextending in a thickness direction within the subject S, a high-energy detectorfor detecting, in a high-energy range, X-rays having been transmitted through a region Rextending in a thickness direction within the subject S, and a timing control sectionfor controlling detection timing of X-rays in the low-energy detectorand the high-energy detectorso that an inspecting region E located at a predetermined site within the subject S is included in the region Rand the region R