The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 02, 2012
Filed:
Oct. 28, 2010
Thomas Allmendinger, Forchheim, DE;
Marc Kachelrieβ, Nürnberg, DE;
Bernhard Schmidt, Fürth, DE;
Philip Stenner, Erlangen, DE;
Thomas Allmendinger, Forchheim, DE;
Marc Kachelrieβ, Nürnberg, DE;
Bernhard Schmidt, Fürth, DE;
Philip Stenner, Erlangen, DE;
Siemens Aktiengesellschaft, Munich, DE;
Abstract
A method is disclosed for reconstructing image data of an examination subject from measured data, wherein a series of measured data sets has previously been acquired during a relative rotational movement between a radiation source of a computed tomography system and the examination subject and the measured data sets relate to the same section of the examination subject at succeeding instants in time. In at least one embodiment, first image data is reconstructed in each case from the measured data sets such that a series of first image data is available. A change variable indicating a change over time within the series of first image data is determined, and a distinction is made between different components of the examination subject in the first image data with the aid of the change variable. This distinction is used for beam hardening correction in an iterative algorithm for calculating enhanced image data.