The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 02, 2012
Filed:
Sep. 29, 2009
Masayuki Hattori, Kanagawa, JP;
Takashi Yokokawa, Kanagawa, JP;
Hidetoshi Kawauchi, Kanagawa, JP;
Hiroyuki Kamata, Kanagawa, JP;
Ryoji Ikegaya, Tokyo, JP;
Masayuki Hattori, Kanagawa, JP;
Takashi Yokokawa, Kanagawa, JP;
Hidetoshi Kawauchi, Kanagawa, JP;
Hiroyuki Kamata, Kanagawa, JP;
Ryoji Ikegaya, Tokyo, JP;
Sony Corporation, Tokyo, JP;
Abstract
Disclosed herein is an information processing apparatus including: a demodulation FFT processing section configured to carry out an FFT process on a demodulation-related signal extracted by making use of a demodulation FFT window from every symbol of a received OFDM signal and output the frequency-domain signal; a control FFT processing section configured to carry out a process equivalent to an FFT process on a control-related signal extracted by making use of a control FFT window from every symbol of the received OFDM signal and output the frequency-domain signal; a transmission-line information estimation section; an equalization section; a reception-quality computation/comparison section; and an FFT-window position control section configured to control the demodulation FFT window to be used by the demodulation FFT processing section and the control FFT window to be used by the control FFT processing section on the basis of a comparison result produced by the reception-quality computation/comparison section.