The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 02, 2012

Filed:

Jun. 14, 2011
Applicants:

KE Han, Fremont, CA (US);

Zining Wu, Los Altos, CA (US);

Michael Madden, Mountain View, CA (US);

Inventors:

Ke Han, Fremont, CA (US);

Zining Wu, Los Altos, CA (US);

Michael Madden, Mountain View, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 5/09 (2006.01);
U.S. Cl.
CPC ...
Abstract

Systems and methods for detecting and designing enhanced disk sync marks using correlation detection are disclosed. The enhanced sync marks provide better noise immunity and higher detection rates over traditional Viterbi-based detection schemes even with a shorter sync mark length. The disk sync mark may provide optimal noise immunity for a particular target polynomial or a plurality of common target polynomials. The minimum Euclidean distance between a candidate sync mark and a plurality of right-shifted versions of the candidate sync mark is computed and compared with other candidate sync marks. The sync mark with the largest minimum Euclidean distance is then selected as the optimal mark. Systems and methods are also disclosed for detecting and designing a disk sync mark using correlation detection when the polarity of the disk is unknown or time-varying.


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