The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 02, 2012

Filed:

Sep. 29, 2008
Applicant:

Hitoshi Ishibashi, Tokyo, JP;

Inventor:

Hitoshi Ishibashi, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 5/00 (2006.01); G06K 9/00 (2006.01); G03G 15/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

In a color misalignment detection method, an alignment pattern is obtained by designating a plurality of lines having line width and line intervals formed by superposing a line image of a black color as a reference color and a line image of a color other than the reference color, for example, a cyan line image, as one patch, and continuously forming these patches by shifting the relative position between the line images of the two colors by an optional quantity. An alignment pattern detection sensor has a light emitting diode and a photodiode. These elements are arranged along the scanning direction of the alignment pattern such that the photodiode can only receive diffused reflected light of reflected light from the alignment pattern. A spot shape of the light emitting diode and a spot shape of the photodiode are both formed in a square shape.


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