The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 02, 2012
Filed:
Jul. 19, 2011
Filipp V Ignatovich, Rochester, NY (US);
Todd Blalock, Penfield, NY (US);
Filipp V Ignatovich, Rochester, NY (US);
Todd Blalock, Penfield, NY (US);
Lumetrics, Inc., Rochester, NY (US);
Abstract
An apparatus for measuring a layered object comprising a low coherence light source, a coherent light source, and an interferometer including a reference arm and a measurement arm. The reference arm is comprised of a first section of polarization maintaining optical fiber engaged with a first fiber stretcher. The measurement arm is comprised of a second section of polarization maintaining optical fiber engaged with a second fiber stretcher. The first and second fiber stretchers are driven so as to alternatingly vary the lengths of the first section of polarization maintaining optical fiber and the second section of polarization maintaining optical fiber, thereby causing interference signals with the low coherence light when the length of the reference arm is equal to the length of the measurement arm including the distance from the second section of polarization maintaining optical fiber to any of the surfaces of the layers of the object.