The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 02, 2012

Filed:

Jan. 24, 2012
Applicants:

Jurgen Dold, Sempach, CH;

Daniel Moser, Seengen, CH;

Roland Zumbrunn, Wittinsburg, CH;

Inventors:

Jurgen Dold, Sempach, CH;

Daniel Moser, Seengen, CH;

Roland Zumbrunn, Wittinsburg, CH;

Assignee:

Leica Geosystems AG, Heerbrugg, CH;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

A measuring system includes a laser tracker (), a target point marked by a reflector (), a surveying apparatus (), and an arithmetic and control unit (). The laser tracker emits a measuring beam (M) which is reflected by the reflector, a process that is used for determining the distance between the laser tracker () and the reflector (). The surveying apparatus has a known position and orientation relative to the measuring beam (M) while preferably being embodied as a survey camera. The inventive measuring system is designed so as to track the reflector () via the measuring beam (M). In a normal tracking mode (A), a measured value for controlling the orientation of the measuring beam (M) is derived from the detection of the measuring beam reflected by the reflector ().


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