The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 02, 2012
Filed:
Mar. 18, 2009
Doug Heermann, Conroe, TX (US);
Karl F. Kiefer, Conroe, TX (US);
Doug Heermann, Conroe, TX (US);
Karl F. Kiefer, Conroe, TX (US);
Invocon, Inc., Conroe, TX (US);
Abstract
A system and method for performing lethality assessment utilizes frequency domain reflectometry (FDR) to determine impact point and damage propagation faults in a detection surface. The detection surface has a conductive layer capable of propagating radio frequency (RF) signals. At least one signal transmit/receive port on the detection surface injects a radio frequency (RF) interrogation signal into the detection surface and at least two signal receive-only ports on the detection surface spaced a distance apart from each other and from the signal transmit/receive port receive reflected radio frequency (RF) signals of the interrogation signal. A frequency domain reflectometry measurement system coupled with the transmit/receive port and signal receive-only ports measures frequency responses of the ports compared to predetermined baseline measurements and determines the precise location of an impact point and damage propagation fault in the detection surface by triangulation.